PIXEL INTENSITIES
Experts
- Hitoshi Kiya
- Daijin Kim
- Chi-Sing Leung
- Sabine Süsstrunk
- Yasuaki Kakehi
- Matteo Perenzoni
- Theo Gevers
- Jaewon Sung
- Shree K. Nayar
- Tien-Tsin Wong
- MaungMaung AprilPyone
- Wei Jia
- Dacheng Tao
- Thomas W. Sederberg
- Tomoharu Nagao
- David Stoppa
- Nicola Massari
- Ramesh Raskar
- Luc Van Gool
- Chin-Chen Chang
- Alexander Wong
- Richa Singh
- Miki Haseyama
- Masatoshi Ishikawa
- Nikola Banic
- David A. Clausi
- Mohammad H. Mahoor
- Sabari Nathan
- Erik Cuevas
- Shiv Ram Dubey
- Imari Sato
- Takeshi Naemura
- Shadrokh Samavi
- Tal Hassner
- Joo-Hwee Lim
- Yong-Guk Kim
- Jean-François Lalonde
- Pasi Fränti
- Xinbo Gao
Venues
- CoRR
- ICIP
- Pattern Recognit.
- IGARSS
- CVPR
- Color Imaging Conference
- IEEE Access
- Sensors
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- IEEE Trans. Image Process.
- Multim. Tools Appl.
- ICCV
- ISBI
- ICASSP
- ICPR
- Pattern Recognit. Lett.
- J. Electronic Imaging
- EUSIPCO
- EMBC
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- IEEE Geosci. Remote. Sens. Lett.
- Medical Imaging: Image Processing
- IEEE Trans. Inf. Theory
- IEEE Trans. Circuits Syst. Video Technol.
- ICME
- J. Vis. Commun. Image Represent.
- Comput. Vis. Image Underst.
- SIU
- SIGGRAPH Posters
- ISCAS
- Expert Syst. Appl.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Commun.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Comput. Electron. Agric.
- ACM Multimedia
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