Login / Signup
New simulation methodology for effects of radiation in semiconductor chip structures.
Henry H. K. Tang
Conal E. Murray
Giovanni Fiorenza
Kenneth P. Rodbell
Michael S. Gordon
David F. Heidel
Published in:
IBM J. Res. Dev. (2008)
Keyphrases
</>
field effect transistors
discrete event simulation
high density
chip design
mathematical analysis
high speed
x ray
semiconductor manufacturing
dynamic characteristics
mathematical model
low cost
simulation study
infrared
neural network
numerical simulations
design methodology
simulation environment
single chip