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SOI FinFET soft error upset susceptibility and analysis.
Phil Oldiges
Kenneth P. Rodbell
Michael S. Gordon
John G. Massey
Kevin Stawiasz
Conal E. Murray
Henry H. K. Tang
K. Kim
K. Paul Muller
Published in:
IRPS (2015)
Keyphrases
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statistical analysis
computer vision
case study
three dimensional
database systems
bayesian networks
data analysis
artificial neural networks
trade off
image analysis
quantitative analysis
error analysis