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SOI FinFET soft error upset susceptibility and analysis.

Phil OldigesKenneth P. RodbellMichael S. GordonJohn G. MasseyKevin StawiaszConal E. MurrayHenry H. K. TangK. KimK. Paul Muller
Published in: IRPS (2015)
Keyphrases
  • statistical analysis
  • computer vision
  • case study
  • three dimensional
  • database systems
  • bayesian networks
  • data analysis
  • artificial neural networks
  • trade off
  • image analysis
  • quantitative analysis
  • error analysis