Timothy D. Sullivan

Publication Activity (10 Years)

Years Active: 1995-2006
Publications (10 Years): 0

Publications

Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan
Application of three-parameter lognormal distribution in EM data analysis. Microelectron. Reliab. 46 (12) (2006)
Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami
Reliability challenges for copper interconnects. Microelectron. Reliab. 44 (3) (2004)
Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan
Early reliability assessment by using deep censoring. Microelectron. Reliab. 43 (1) (2003)
James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus
IBM experiments in soft fails in computer electronics (1978-1994). IBM J. Res. Dev. 40 (1) (1996)
Chao-Kun Hu, Kenneth P. Rodbell, Timothy D. Sullivan, Kim Y. Lee, Dennis P. Bouldin
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines. IBM J. Res. Dev. 39 (4) (1995)