Hans P. Muhlfeld

Publication Activity (10 Years)

Years Active: 1996-1998
Publications (10 Years): 0

Publications

James F. Ziegler, Martin E. Nelson, James Dean Shell, R. Jerry Peterson, Carl J. Gelderloos, Hans P. Muhlfeld, Charles J. Montrose
Cosmic ray soft error rates of 16-Mb DRAM memory chips. IEEE J. Solid State Circuits 33 (2) (1998)
James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, Timothy J. O'Gorman, John M. Ross
Accelerated testing for cosmic soft-error rate. IBM J. Res. Dev. 40 (1) (1996)
James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus
IBM experiments in soft fails in computer electronics (1978-1994). IBM J. Res. Dev. 40 (1) (1996)
Timothy J. O'Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh
Field testing for cosmic ray soft errors in semiconductor memories. IBM J. Res. Dev. 40 (1) (1996)