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Field testing for cosmic ray soft errors in semiconductor memories.

Timothy J. O'GormanJohn M. RossAllen H. TaberJames F. ZieglerHans P. MuhlfeldCharles J. MontroseHuntington W. CurtisJames L. Walsh
Published in: IBM J. Res. Dev. (1996)
Keyphrases
  • test cases
  • neural network
  • information retrieval
  • learning algorithm
  • test data
  • semiconductor manufacturing