Linda M. Head

Publication Activity (10 Years)

Years Active: 2000-2017
Publications (10 Years): 1

Top Topics

Vector Quantizer

Decision Level Fusion

Top Venues

J. Signal Process. Syst.

Publications

Russell Ondusko, Matthew Marbach, Ravi Prakash Ramachandran, Linda M. Head
Blind Signal-to-Noise Ratio Estimation of Speech Based on Vector Quantizer Classifiers and Decision Level Fusion. J. Signal Process. Syst. 89 (2) (2017)
Ying Tang, Linda M. Head, Ravi Prakash Ramachandran, Lawrence M. Chatman
Vertical Integration of System-on-Chip Concepts in the Digital Design Curriculum. IEEE Trans. Educ. 54 (2) (2011)
Ying Tang, Linda M. Head, Ravi Prakash Ramachandran, Lawrence M. Chatman
Vertical integration of system-on-chip concepts in the digital design curriculum. MSE (2009)
Matthew Marbach, Russell Ondusko, Ravi Prakash Ramachandran, Linda M. Head
Neural Network Classifiers and Principal Component Analysis for Blind Signal to Noise Ratio Estimation of Speech Signals. ISCAS (2009)
Russell Ondusko, Matthew Marbach, Ravi Prakash Ramachandran, Linda M. Head, Mark C. Huggins
A vector quantizer classifier for blind signal to noise ratio estimation of speech signals. ISCAS (2006)
Russell Ondusko, Matthew Marbach, A. McClellan, Ravi Prakash Ramachandran, Linda M. Head, Mark C. Huggins, Brett Y. Smolenski
Blind Determination of the Signal to Noise Ratio of Speech Signals Based on Estimation Combination of Multiple Features. APCCAS (2006)
David L. Reynolds, Linda M. Head, Ravi Prakash Ramachandran
VLSI architecture for the efficient computation of line spectral frequencies. ISCAS (3) (2003)
Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan
Early reliability assessment by using deep censoring. Microelectron. Reliab. 43 (1) (2003)
Linda M. Head
Incorporating EDA into the Rowan ECE Curriculum. MSE (2003)
Linda M. Head, Gay Canough, Ravi Prakash Ramachandran
Real-world design as a one-semester undergraduate project: example of a robust and low-cost solar lantern. IEEE Trans. Educ. 45 (4) (2002)
Craig C. F. Fahrenkrug, Linda M. Head
Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects. IEEE Trans. Instrum. Meas. 49 (4) (2000)