Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects.
Craig C. F. FahrenkrugLinda M. HeadPublished in: IEEE Trans. Instrum. Meas. (2000)
Keyphrases
- automatic detection
- detection algorithm
- detection accuracy
- object detection
- false positives
- false alarms
- signal processing
- anomaly detection
- data sets
- input output
- test cases
- detection method
- pattern recognition
- computer vision
- digital images
- image segmentation
- artificial intelligence
- data mining
- multi channel
- real world
- database
- automated detection