Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology.
Pong-Fei LuKeith A. JenkinsK. Paul MullerRalf SchauflerPublished in: IRPS (2015)
Keyphrases
- data collection
- long term
- data sets
- data processing
- high quality
- data analysis
- synthetic data
- image data
- data sources
- data structure
- prior knowledge
- original data
- raw data
- data mining techniques
- input data
- case study
- computer systems
- end users
- data quality
- experimental data
- statistical analysis
- special purpose hardware
- x ray
- knowledge discovery
- xml documents
- data mining
- databases