Login / Signup

Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products.

Gerald NeumannJ. TouzelRainer Duschl
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • high speed
  • data mining
  • machine learning
  • search engine
  • data structure
  • data analysis
  • multi dimensional
  • high density
  • real world
  • information systems
  • e learning
  • image analysis
  • statistical analysis
  • mathematical analysis