TECHNICAL ASPECTS
Experts
- Dragos Vieru
- André Ivanov
- Ulrika H. Westergren
- Madhusanka Liyanage
- Simeon Vidolov
- Margaret-Anne D. Storey
- Michael B. Knight
- B. Dawn Medlin
- Helmut Krcmar
- Matti Tedre
- Peng Liang
- Jyri Kemppainen
- Parvaneh Asghari
- Thippa Reddy Gadekallu
- Tripti Goel
- Hussam Amrouch
- Frank Maurer
- Pekka Abrahamsson
- Georges Gardarin
- Philip O'Reilly
- Nathan Lambert
- Mahmoud Daneshmand
- Mugen Peng
- Wei-Yun Chiu
- Zengyang Li
- Paris Avgeriou
- Mark Gaynor
- Rob Procter
- Thomas Zimmermann
- Mohamed Amine Ferrag
- Chien-Ching Li
- Ramakrishnan Raman
- Muhammad Rizwan Anwar
- Andreas F. Molisch
- Shen Wang
- Nyyti Saarimäki
- Hamid Haj Seyyed Javadi
- Nigel W. John
- Jens Heuschkel
Venues
- CoRR
- HICSS
- IEEE Access
- J. Electron. Test.
- Sensors
- IEEE Commun. Mag.
- ECIS
- IEEE Trans. Engineering Management
- EDUCON
- IGARSS
- AMCIS
- STAST
- SMC
- AI Soc.
- ICSE
- MedInfo
- Proc. IEEE
- LREC
- Int. J. Online Biomed. Eng.
- Computer
- IEEE Softw.
- SIGDOC
- ISQED
- Int. J. Online Eng.
- ETFA
- Microelectron. Reliab.
- IEEE Commun. Surv. Tutorials
- ProComm
- Educ. Inf. Technol.
- ACIT
- ASP-DAC
- EMBC
- Libr. Hi Tech
- Int. J. Autom. Technol.
- ESSDERC
- CHI Extended Abstracts
- CSCW
- Comput. Law Secur. Rev.
- J. Assoc. Inf. Sci. Technol.
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