TECHNICAL ASPECTS
Experts
- Dragos Vieru
- André Ivanov
- Ulrika H. Westergren
- Madhusanka Liyanage
- Margaret-Anne D. Storey
- Michael B. Knight
- Simeon Vidolov
- Matti Tedre
- B. Dawn Medlin
- Helmut Krcmar
- Peng Liang
- Jyri Kemppainen
- Parvaneh Asghari
- Irum Inayat
- Sabrina Marczak
- Siti Salwah Salim
- Brij B. Gupta
- Andy Zaidman
- Robert Demolombe
- Fabio Massacci
- Jorge E. Camargo
- Yabing Jiang
- Sheeba Armoogum
- Thomas Krendl Gilbert
- Georges Gardarin
- John Kornak
- Antoine Isaac
- Elizabeth F. Churchill
- Hang Wang
- Robin L. Dillon
- Lyrene Fernandes da Silva
- Ellen Balka
- Huansheng Ning
- T. D. Wilson
- Danilo Monarca
- Fabio A. González
- Chien-Ching Li
- Ronald N. Kostoff
- Yujia Lin
Venues
- CoRR
- HICSS
- IEEE Access
- J. Electron. Test.
- Sensors
- IEEE Commun. Mag.
- ECIS
- IEEE Trans. Engineering Management
- IGARSS
- AMCIS
- STAST
- EDUCON
- SMC
- MedInfo
- ICSE
- AI Soc.
- Computer
- Proc. IEEE
- LREC
- SIGDOC
- ISQED
- Microelectron. Reliab.
- IEEE Softw.
- Int. J. Online Eng.
- IEEE Commun. Surv. Tutorials
- ETFA
- Sci. Eng. Ethics
- Int. J. Autom. Technol.
- EMBC
- SIGCSE
- Int. J. Technol. Manag.
- Libr. Hi Tech
- AMIA
- Comput. Law Secur. Rev.
- IEEE Technol. Soc. Mag.
- ASP-DAC
- ESSDERC
- Int. J. Medical Informatics
- CSCW
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