TECHNICAL ASPECTS
Experts
- André Ivanov
- Dragos Vieru
- Madhusanka Liyanage
- Ulrika H. Westergren
- Michael B. Knight
- Margaret-Anne D. Storey
- Simeon Vidolov
- Jyri Kemppainen
- Parvaneh Asghari
- Matti Tedre
- B. Dawn Medlin
- Helmut Krcmar
- Peng Liang
- Tom Johnson
- Alexander Chatzigeorgiou
- Andrea Colantoni
- Ronald N. Kostoff
- Steven Alter
- Hans-Jürgen Sebastian
- Hiroshi Harada
- T. D. Wilson
- Guilherme Horta Travassos
- George Kosteletos
- Georgios Gousios
- Jobson L. Massollar
- Witold P. Maszara
- Alireza Souri
- Karen Estlund
- Stefan Hochwarter
- Jianguo Ding
- Maria Spichkova
- Chen Sun
- Heinz W. Schmidt
- Hang Wang
- Karl Young
- Maarten Zeinstra
- Biswadip Ghosh
- Richard J. Urban
- Jean Le Bihan
Venues
- CoRR
- HICSS
- IEEE Access
- J. Electron. Test.
- Sensors
- IEEE Commun. Mag.
- ECIS
- IEEE Trans. Engineering Management
- EDUCON
- IGARSS
- AMCIS
- STAST
- SMC
- MedInfo
- ICSE
- AI Soc.
- Int. J. Online Biomed. Eng.
- LREC
- Proc. IEEE
- Computer
- ISQED
- IEEE Softw.
- SIGDOC
- IEEE Commun. Surv. Tutorials
- Microelectron. Reliab.
- ProComm
- ETFA
- Int. J. Online Eng.
- TechDebt@ICSE
- J. Assoc. Inf. Sci. Technol.
- Comput. Law Secur. Rev.
- CSCW
- CHI Extended Abstracts
- Int. J. Medical Informatics
- Sci. Eng. Ethics
- FIE
- EMBC
- ASP-DAC
- Educ. Inf. Technol.
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