TECHNICAL ASPECTS
Experts
- Dragos Vieru
- André Ivanov
- Ulrika H. Westergren
- Madhusanka Liyanage
- Simeon Vidolov
- Margaret-Anne D. Storey
- Michael B. Knight
- Helmut Krcmar
- B. Dawn Medlin
- Matti Tedre
- Peng Liang
- Parvaneh Asghari
- Jyri Kemppainen
- Thomas Zimmermann
- Mohamed Amine Ferrag
- Zengyang Li
- Paris Avgeriou
- Mark Gaynor
- Rob Procter
- Ramakrishnan Raman
- Muhammad Rizwan Anwar
- Andreas F. Molisch
- Shen Wang
- Chien-Ching Li
- Tripti Goel
- Hussam Amrouch
- Frank Maurer
- Thippa Reddy Gadekallu
- Mugen Peng
- Wei-Yun Chiu
- Pekka Abrahamsson
- Georges Gardarin
- Philip O'Reilly
- Nathan Lambert
- Mahmoud Daneshmand
- Talita Vieira Ribeiro
- Jenna L. Butler
- Felipe Restrepo-Calle
- Patrick Peiffer
Venues
- CoRR
- HICSS
- IEEE Access
- J. Electron. Test.
- Sensors
- IEEE Commun. Mag.
- ECIS
- EDUCON
- IEEE Trans. Engineering Management
- STAST
- IGARSS
- AMCIS
- ICSE
- MedInfo
- AI Soc.
- SMC
- Computer
- Int. J. Online Biomed. Eng.
- Proc. IEEE
- LREC
- Microelectron. Reliab.
- IEEE Commun. Surv. Tutorials
- ProComm
- Int. J. Online Eng.
- ETFA
- ISQED
- IEEE Softw.
- SIGDOC
- IEEE Technol. Soc. Mag.
- Int. J. Technol. Manag.
- ICMC
- Gov. Inf. Q.
- SIGCSE
- Kybernetes
- Electron. J. Inf. Syst. Dev. Ctries.
- AMIA
- CHI Extended Abstracts
- CSCW
- Comput. Law Secur. Rev.
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