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Radiation damage characterization of digital integrated circuits.
Santiago Sondon
Pablo Sergio Mandolesi
Pedro Julián
Felix Palumbo
Martin Alurralde
Alberto Filevich
Published in:
LATW (2009)
Keyphrases
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integrated circuit
x ray
infrared
printed circuit boards
database
electron beam
digital content
digital objects
data sets
neural network
social networks
information systems
medical imaging
circuit design
damage assessment