Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices.
Nagarajan RaghavanMichel BosmanDaniel D. FreyKin Leong PeyPublished in: Microelectron. Reliab. (2014)
Keyphrases
- probabilistic model
- computational model
- wide range
- statistical model
- parameter estimation
- generation process
- metamodel
- management system
- formal model
- reasoning process
- real time
- diffusion process
- optimization process
- mathematical model
- process model
- multiscale
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- knowledge base
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