Michel Bosman

Publication Activity (10 Years)

Years Active: 2014-2020
Publications (10 Years): 11

Top Topics

Silicon Dioxide

Physical Education

Spatial Correlation

Top Venues

Microelectron. Reliab.

Tangible and Embedded Interaction

CHI PLAY (Companion)

Publications

Alok Ranjan, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. IRPS (2020)
Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS (2018)
Danica Mast, Michel Bosman, Sylvia Schipper, Sanne de Vries
BalanSAR: Using Spatial Augmented Reality to Train Children's Balancing Skills in Physical Education. Tangible and Embedded Interaction (2017)
Danica Mast, Michel Bosman, Sylvia Schipper, Samantha Diederiks, Sanne de Vries
Adding Interactivity to BalanSAR: a Spatial Augmented Reality Game for Balancing in Physical Education. CHI PLAY (Companion) (2017)
Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
-based MIM stacks: Computational and physical insight. Microelectron. Reliab. 64 (2016)
Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey
defect size in Ni/dielectric/Si RRAM devices. Microelectron. Reliab. 61 (2016)
Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
dielectric stacks for failure analysis. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. IRPS (2015)
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer. IRPS (2015)
Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Michel Bosman, Daniel D. Frey, Kin Leong Pey
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. Microelectron. Reliab. 54 (9-10) (2014)
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. Microelectron. Reliab. 54 (9-10) (2014)
Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey
interfacial layer. Microelectron. Reliab. 54 (9-10) (2014)