Kalya Shubhakar

Publication Activity (10 Years)

Years Active: 2014-2022
Publications (10 Years): 8

Top Topics

Atomic Force Microscopy

Learning Experience

Leakage Current

Top Venues

Microelectron. Reliab.

Publications

Kalya Shubhakar, Chee Huei Lee, Tee Hui Teo
Enhanced Learning Experience for Remote Students in Hybrid Class Model using 360° View Camera and Telepresence Robot. TALE (2022)
Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. IRPS (2020)
Kin Leong Pey, Alok Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. IRPS (2019)
Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS (2018)
Xuan Feng, Shurong Dong, Hei Wong, Danqun Yu, Kin Leong Pey, Kalya Shubhakar, W. S. Lau
stack. Microelectron. Reliab. 61 (2016)
Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
-based MIM stacks: Computational and physical insight. Microelectron. Reliab. 64 (2016)
Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey
RRAM using conductive AFM. Microelectron. Reliab. 64 (2016)
Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
dielectric stacks for failure analysis. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Kin Leong Pey, Kalya Shubhakar
High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact. Microelectron. Reliab. 54 (5) (2014)
Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey
interfacial layer. Microelectron. Reliab. 54 (9-10) (2014)