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Experts
- Sonya A. Coleman
- Bryan W. Scotney
- Bryan Gardiner
- Janez Zerovnik
- Shanmugalingam Suganthan
- Dimitri Van De Ville
- Frank Sottile
- D. Gnanaraj Thomas
- Rik Van de Walle
- Rafal Witkowski
- Paul S. Bonsma
- Ignace Lemahieu
- Chungang Zhu
- Felix Breuer
- Hongsheng Li
- Nagarajan Raghavan
- Youssef Hamadi
- Guang Deng
- Jesus Selva
- Ole Brun Madsen
- Jens Myrup Pedersen
- Maura Pintor
- Nizar Bouguila
- Prateek Mittal
- Sisi Zhao
- Soheil Feizi
- Battista Biggio
- Lizhuang Ma
- Hujun Bao
- Jyh-Da Wei
- Ahmed Patel
- Thomas Durieux
- Petra Sparl
- Lamberto Ballan
- Kacper Pluta
- Andrew Vince
- Fabio Roli
- Zhiyong Cheng
- Yosef E. Maruvka
Venues
- CoRR
- IEEE Access
- Comput. Aided Geom. Des.
- CVPR
- Comput. Aided Des.
- Sensors
- J. Comput. Phys.
- Appl. Math. Comput.
- Trans. GIS
- IEEE Trans. Image Process.
- Inf. Process. Lett.
- ICIP
- IEEE Geosci. Remote. Sens. Lett.
- USENIX Security Symposium
- ICSE
- Math. Comput. Simul.
- IEEE SENSORS
- Appl. Math. Lett.
- Ars Comb.
- Comput. Geosci.
- IEEE Trans. Computers
- ACM Multimedia
- MWSCAS
- ICASSP
- Pattern Recognit. Lett.
- SIAM J. Math. Anal.
- ACM Trans. Graph.
- SIBGRAPI
- IET Image Process.
- IEICE Trans. Inf. Syst.
- ISCAS
- Comput. Math. Appl.
- Adv. Eng. Softw.
- IRPS
- ICECS
- Comput. Graph.
- IEEE Trans. Autom. Control.
- CAD/Graphics
- CRV
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