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Experts
- Sonya A. Coleman
- Bryan W. Scotney
- Bryan Gardiner
- Janez Zerovnik
- D. Gnanaraj Thomas
- Chungang Zhu
- Dimitri Van De Ville
- Rik Van de Walle
- Rafal Witkowski
- Ignace Lemahieu
- Felix Breuer
- Frank Sottile
- Shanmugalingam Suganthan
- Paul S. Bonsma
- Junjie Ni
- Dacheng Tao
- Lamberto Ballan
- Isabella Hoffmann
- Guglielmo Camporese
- Adel Ammar
- Mingxi Zhao
- Kin Leong Pey
- Ahmed Patel
- Ole Brun Madsen
- Maura Pintor
- Xianglong Liu
- Sisi Zhao
- Michael Elad
- Howard A. Zebker
- Waseem Waheed
- Sean J. O'Shea
- Zan Gao
- Le An
- Michal Edelstein
- Hadar Hezi
- Daniele Angioni
- Martin Monperrus
- Agnès Desolneux
- Guofeng Zhang
Venues
- CoRR
- Comput. Aided Geom. Des.
- IEEE Access
- CVPR
- Comput. Aided Des.
- Sensors
- Appl. Math. Comput.
- J. Comput. Phys.
- Trans. GIS
- IEEE Trans. Image Process.
- Inf. Process. Lett.
- ICIP
- Math. Comput. Simul.
- ICASSP
- ICSE
- Ars Comb.
- ACM Multimedia
- USENIX Security Symposium
- ACM Trans. Graph.
- Pattern Recognit. Lett.
- IEEE Trans. Computers
- Appl. Math. Lett.
- IEEE SENSORS
- SIAM J. Math. Anal.
- MWSCAS
- Comput. Geosci.
- IEEE Geosci. Remote. Sens. Lett.
- IEICE Trans. Inf. Syst.
- Adv. Eng. Softw.
- IET Image Process.
- ALIFE
- ICMC
- J. Math. Imaging Vis.
- BioCAS
- CAD/Graphics
- ICECS
- CRV
- ICLR
- SIAM J. Appl. Math.
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