Sean J. O'Shea

Publication Activity (10 Years)

Years Active: 2007-2020
Publications (10 Years): 6

Top Topics

Silicon Dioxide

Computationally Tractable

Top Venues

Microelectron. Reliab.

Publications

Alok Ranjan, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. IRPS (2020)
Kin Leong Pey, Alok Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. IRPS (2019)
Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS (2018)
Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
-based MIM stacks: Computational and physical insight. Microelectron. Reliab. 64 (2016)
Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey
RRAM using conductive AFM. Microelectron. Reliab. 64 (2016)
Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
dielectric stacks for failure analysis. Microelectron. Reliab. 55 (9-10) (2015)
Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey
interfacial layer. Microelectron. Reliab. 54 (9-10) (2014)
Arijit Roy, Cher Ming Tan, Sean J. O'Shea, Kedar Hippalgaonkar, Wulf Hofbauer
Room temperature observation of point defect on gold surface using thermovoltage mapping. Microelectron. Reliab. 47 (9-11) (2007)