Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory.
Nagarajan RaghavanMichel BosmanKin Leong PeyPublished in: Microelectron. Reliab. (2015)
Keyphrases
- bayesian networks
- probabilistic model
- probabilistic logic
- random access
- small scale
- data driven
- low memory
- uncertain data
- memory requirements
- machine learning
- simplex method
- memory space
- computing power
- posterior probability
- information theoretic
- databases
- belief networks
- linear programming
- computational power
- graphical models
- data structure
- image segmentation
- e learning
- learning algorithm
- reliability assessment