A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques.
Dan JiangWeihua LinNagarajan RaghavanPublished in: IEEE Access (2020)
Keyphrases
- semiconductor manufacturing
- main contribution
- support vector
- pattern recognition
- support vector machine
- fold cross validation
- decision trees
- conceptual framework
- classification method
- feature space
- svm classifier
- image classification
- supervised learning
- automatic classification
- support vector machine svm
- text classification
- classification accuracy
- probabilistic model
- machine learning
- data sets
- decision rules
- preprocessing
- machine learning methods
- face recognition
- artificial intelligence
- neural network