Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices.
Nagarajan RaghavanPublished in: Microelectron. Reliab. (2016)
Keyphrases
- probability distribution
- high level
- cost function
- mathematical model
- theoretical framework
- clustering method
- input data
- neural network
- hierarchical structure
- neural network model
- clustering algorithm
- management system
- posterior probability
- fuzzy clustering
- formal model
- statistical information
- cluster membership
- self organizing maps
- data points
- probabilistic model
- k means
- mobile devices
- similarity measure
- feature selection
- data mining