Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices.

Nagarajan Raghavan

Published in: Microelectron. Reliab. (2016)

Keyphrases

probability distribution
high level
cost function
mathematical model
theoretical framework
clustering method
input data

neural network
hierarchical structure
neural network model
clustering algorithm
management system
posterior probability

fuzzy clustering
formal model
statistical information
cluster membership
self organizing maps
data points

probabilistic model
k means
mobile devices
similarity measure
feature selection
data mining