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Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory.
Nagarajan Raghavan
Daniel D. Frey
Kin Leong Pey
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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long term
memory usage
computing power
accurate estimation
design methodology
data corruption
real time
low memory
limited memory
memory requirements
main memory
maximum likelihood estimation
estimation algorithm
daily life
estimation accuracy
memory space
least squares
neural network