Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms.
Dan JiangWeihua LinNagarajan RaghavanPublished in: IEEE Access (2021)
Keyphrases
- multi objective optimization
- semiconductor manufacturing
- complex optimization problems
- optimization problems
- multi objective
- evolutionary algorithm
- evolutionary strategy
- combinatorial optimization
- genetic algorithm
- integrated circuit
- optimal design
- multi objective evolutionary algorithms
- computational efficiency
- combinatorial optimization problems
- pareto optimal
- bi objective
- estimation of distribution algorithms
- dynamic programming
- optimum design