A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction.
Dan JiangWeihua LinNagarajan RaghavanPublished in: IEEE Access (2021)
Keyphrases
- gaussian mixture model
- semiconductor manufacturing
- clustering ensemble
- mixture model
- prediction accuracy
- feature vectors
- em algorithm
- maximum likelihood
- expectation maximization
- process control
- feature space
- data sets
- data clustering
- consensus clustering
- k means
- genetic programming
- combining multiple
- image segmentation