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- Kwang-Baek Kim
- P. T. Lai
- Steven J. E. Wilton
- Tsuneki Yamasaki
- X. D. Huang
- Ryosuke Ozaki
- Nitul Dutta
- Assem A. M. Bsoul
- Zhanbo Yang
- Guoxian Song
- Boris Düdder
- Kedong Wang
- Jin-Soo Kim
- Ying Hou
- Wojciech Samek
- Di He
- Randy Verdecia-Peña
- Seung-Hwan Choi
- Lingqiao Liu
- Yongluan Zhou
- Zhan Chen
- Yuval Shahar
- Olfa Kanoun
- Kai Zheng
- Jianfei Cai
- Huishuai Zhang
- Yifei Zhu
- Lin Jingzhou
- Chuanxia Zheng
- Ruibin Xiong
- Kai-Yuan Chao
- Qinghu Zhang
- Tie-Yan Liu
- Fei Hu
- César L. C. Mattos
- Larry D. Pyeatt
- Yuval Elovici
- Sung-In Jung
- Woonhyuk Baek
Venues
- CoRR
- Microelectron. Reliab.
- Sensors
- IEEE Access
- IEICE Trans. Electron.
- IJCNN
- IEICE Electron. Express
- Neurocomputing
- NEMS
- Displays
- RFC
- IEEE Commun. Mag.
- J. Vis.
- IGARSS
- SMC
- Neural Process. Lett.
- DAC
- IEEE SENSORS
- Wirel. Pers. Commun.
- ACC
- IACR Cryptol. ePrint Arch.
- Multim. Tools Appl.
- Remote. Sens.
- IEEE Trans. Computers
- Comput. Electron. Agric.
- Microelectron. J.
- Future Gener. Comput. Syst.
- VLSI Design
- OFC
- IEEE Trans. Instrum. Meas.
- ICASSP
- Multim. Syst.
- Appl. Math. Comput.
- Symmetry
- APWeb
- IEEE Trans. Geosci. Remote. Sens.
- CCIS
- ICPR
- GLOBECOM
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