MIDDLE LAYER
Experts
- Kwang-Baek Kim
- P. T. Lai
- Nitul Dutta
- X. D. Huang
- Assem A. M. Bsoul
- Steven J. E. Wilton
- Ryosuke Ozaki
- Tsuneki Yamasaki
- Yanyan Lan
- Chuanxia Zheng
- Kangho Kim
- Kai Ouyang
- Chunhua Shen
- Xiaofei Xu
- Bahar Azari
- Haisheng Xu
- Tat-Jen Cham
- Lingqiao Liu
- Kai-Yuan Chao
- Ruibin Xiong
- Fei Hu
- Zhan Chen
- Tie-Yan Liu
- David Hung-Chang Du
- Yunchang Yang
- Erez Shalom
- Luis A. Freitas
- Chen Xing
- Sungwoong Kim
- Alphan Sahin
- Seung-Hwan Choi
- Zhaoyue Lü
- Qinghu Zhang
- Larry D. Pyeatt
- Li Li
- Ildoo Kim
- Chen Tang
- Huishuai Zhang
- César L. C. Mattos
Venues
- CoRR
- Microelectron. Reliab.
- Sensors
- IEEE Access
- IEICE Electron. Express
- IJCNN
- IEICE Trans. Electron.
- Neurocomputing
- NEMS
- J. Vis.
- RFC
- Displays
- IGARSS
- IEEE Commun. Mag.
- SMC
- Neural Process. Lett.
- ACC
- Multim. Tools Appl.
- Remote. Sens.
- IEEE Trans. Computers
- DAC
- Wirel. Pers. Commun.
- IEEE SENSORS
- IACR Cryptol. ePrint Arch.
- NeurIPS
- DSD
- ICS
- Multim. Syst.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Geosci. Remote. Sens.
- ICPR
- APLAS
- IEEE Trans. Very Large Scale Integr. Syst.
- Comput. Electron. Agric.
- Neural Comput. Appl.
- APWeb
- Appl. Math. Comput.
- Commun. Nonlinear Sci. Numer. Simul.
- SIAM J. Appl. Math.
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