K. Schepers

Publication Activity (10 Years)

Years Active: 2004-2004
Publications (10 Years): 0

Publications

Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44 (9-11) (2004)