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MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.
Leen Biesemans
K. Schepers
Kris Vanstreels
Jan D'Haen
Ward De Ceuninck
Marc D'Olieslaeger
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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statistical tests
test generation
dynamic environments
test suite
null hypothesis
input output
genetic algorithm
multiple choice
dynamically changing
test data
test cases
neural network
statistical significance
software testing
image processing
information systems
artificial intelligence
post hoc
diagnostic tests