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Read Stability and Write-Ability Analysis of SRAM Cells for Nanometer Technologies.
Evelyn Grossar
Michele Stucchi
Karen Maex
Wim Dehaene
Published in:
IEEE J. Solid State Circuits (2006)
Keyphrases
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statistical analysis
data mining
three dimensional
image analysis
quantitative analysis
data sets
neural network
learning algorithm
artificial intelligence
sufficient conditions
data transmission
stability analysis