SURFACE FITTING
Experts
- Hongwei Lin
- Hans-Peter Seidel
- Jörg Peters
- Jun-Hai Yong
- Wenping Wang
- Bert Jüttler
- Jianmin Zheng
- Andrés Iglesias
- Zhongke Wu
- Hong Qin
- Akemi Gálvez
- Helmut Pottmann
- Elaine Cohen
- Tamal K. Dey
- Falai Chen
- Renaud Marlet
- Jean-Claude Paul
- Caiming Zhang
- Qingqing Wu
- Xingce Wang
- Fuhua Cheng
- Weiyin Ma
- Takashi Maekawa
- Malcolm A. Sabin
- Mingquan Zhou
- Yang Liu
- Zhouwang Yang
- Joachim Giesen
- Jun Wang
- Kestutis Karciauskas
- Wayne Tiller
- Denis Zorin
- Les A. Piegl
- Kan-Le Shi
- Ying-Chang Liang
- Guozhao Wang
- Pierre Alliez
- Yu-Shen Liu
- Gabriel Taubin
Venues
- CoRR
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- Sensors
- IGARSS
- Remote. Sens.
- ACM Trans. Graph.
- Comput. Graph.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Access
- Comput. Graph. Forum
- Vis. Comput.
- ICRA
- CVPR
- Appl. Math. Comput.
- ICCV
- IEEE Trans. Vis. Comput. Graph.
- IMA Conference on the Mathematics of Surfaces
- CAD/Graphics
- J. Comput. Appl. Math.
- GMP
- J. Comput. Phys.
- NEMS
- SIGGRAPH
- IEEE Computer Graphics and Applications
- EMBC
- IEEE Trans. Instrum. Meas.
- IEEE Wirel. Commun. Lett.
- SCG
- ICIP
- Graph. Model.
- J. Comput. Chem.
- IEEE Trans. Biomed. Eng.
- IEICE Trans. Electron.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Discret. Comput. Geom.
- SIAM J. Appl. Math.
- Adv. Comput. Math.
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