A. Dehbi

Publication Activity (10 Years)

Years Active: 2002-2006
Publications (10 Years): 0

Publications

V. Krieger, Wolfgang Wondrak, A. Dehbi, W. Bartel, Yves Ousten, Bruno Levrier
Defect detection in multilayer ceramic capacitors. Microelectron. Reliab. 46 (9-11) (2006)
A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak
Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectron. Reliab. 45 (9-11) (2005)
H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi
Failure mechanisms and qualification testing of passive components. Microelectron. Reliab. 45 (9-11) (2005)
A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron. Reliab. 42 (6) (2002)