Defect detection in multilayer ceramic capacitors.

V. Krieger Wolfgang Wondrak A. Dehbi W. Bartel Yves Ousten Bruno Levrier

Published in: Microelectron. Reliab. (2006)

Keyphrases

defect detection
feature extraction
automated visual inspection
integrated circuit
textured surfaces
support vector
database
databases
computer vision
pattern recognition
expert systems
high dimensional
query processing
wireless sensor networks
fractional fourier transform