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Experts
- Ricardo Campos
- Adam Jatowt
- Sumit Bhatia
- Dimosthenis Karatzas
- Umapada Pal
- Ching Y. Suen
- Chew Lim Tan
- Swapan K. Parui
- Partha Pratim Roy
- Mohamed Cheriet
- P. Nagabhushan
- Gueesang Lee
- Enrique Vidal
- Verónica Romero
- Nikos Papamarkos
- Alejandro H. Toselli
- Rangachar Kasturi
- Kazem Taghva
- Christian Reul
- Alípio Jorge
- Cheng-Lin Liu
- Adel M. Alimi
- Toru Wakahara
- Chucai Yi
- Soo-Hyung Kim
- Ujjwal Bhattacharya
- Conceição Rocha
- João Paulo Cordeiro
- Daniel P. Lopresti
- Charalambos Strouthopoulos
- Santanu Chaudhury
- Xiangyang Xue
- Hongtao Xie
- Jun Sun
- Frank Puppe
- George Nagy
- Anandarup Roy
- Céline Mancas-Thillou
- Yue Lu
Venues
- CoRR
- ICDAR
- ICPR
- Pattern Recognit.
- Document Analysis Systems
- ICIP
- CVPR
- DRR
- IEEE Trans. Image Process.
- Int. J. Document Anal. Recognit.
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- Multim. Tools Appl.
- IGARSS
- CLEF (Working Notes)
- Int. J. Pattern Recognit. Artif. Intell.
- LREC
- Pattern Recognit. Lett.
- SIGIR Forum
- BMC Bioinform.
- IEICE Trans. Inf. Syst.
- ICCCNT
- ICACCI
- ACPR
- MVA
- DAS
- Int. J. Image Graph.
- ACM Multimedia
- COLING
- CIKM
- ECIR (2)
- J. Electronic Imaging
- PReMI
- SMC
- SIGIR
- Document Recognition
- Sensors
- ICME
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