L. De Schepper

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 3

Top Topics

Electrical Properties

Stress Distribution

Top Venues

Publications

M. Avramenko, L. De Schepper, J.-F. Cano, F. Geenen, Peter Moens, Alberto Marcuzzi, Carlo De Santi, Matteo Meneghini
Threshold Voltage Drift and Recovery of SiC Trench MOSFETs During TDDB Stress. IRPS (2024)
Peter Moens, F. Geenen, L. De Schepper, JF Cano, J. Lettens, S. Maslougkas, J. Franchi, Martin Domeij
The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study. IRPS (2023)
Peter Moens, Abhishek Banerjee, P. Coppens, A. Constant, Piet Vanmeerbeek, Z. Li, F. Declercq, L. De Schepper, H. De Vleeschouwer, C. Liu, B. Padmanabhan, W. Jeon, J. Guo, A. Salih, Marnix Tack
Technology and design of GaN power devices. ESSDERC (2015)