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Threshold Voltage Drift and Recovery of SiC Trench MOSFETs During TDDB Stress.
M. Avramenko
L. De Schepper
J.-F. Cano
F. Geenen
Peter Moens
Alberto Marcuzzi
Carlo De Santi
Matteo Meneghini
Published in:
IRPS (2024)
Keyphrases
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low voltage
power system
image recovery
recovery algorithm
electric field
data sets
high voltage
normal operation
power supply
design considerations
operating conditions
database
concept drift
disaster recovery
case study
artificial intelligence
machine learning
stress distribution