F. Geenen

Publication Activity (10 Years)

Years Active: 2022-2024
Publications (10 Years): 5

Top Topics

Stress Distribution

Lessons Learned

Top Venues

Publications

M. Avramenko, L. De Schepper, J.-F. Cano, F. Geenen, Peter Moens, Alberto Marcuzzi, Carlo De Santi, Matteo Meneghini
Threshold Voltage Drift and Recovery of SiC Trench MOSFETs During TDDB Stress. IRPS (2024)
Peter Moens, F. Geenen, M. Avramenko, G. Gomez-Garcia, Kevin Matocha
On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs. IRPS (2024)
Alberto Marcuzzi, M. Avramenko, Carlo De Santi, Peter Moens, F. Geenen, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements. IRPS (2024)
Peter Moens, F. Geenen, L. De Schepper, JF Cano, J. Lettens, S. Maslougkas, J. Franchi, Martin Domeij
The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study. IRPS (2023)
Fabrizio Masin, Carlo De Santi, Arno Stockman, J. Lettens, F. Geenen, Gaudenzio Meneghesso, Enrico Zanoni, Peter Moens, Matteo Meneghini
Analysis and Modeling of Vth Shift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature. IRPS (2022)