Martin Domeij

Publication Activity (10 Years)

Years Active: 2003-2023
Publications (10 Years): 2

Top Topics

Electrical Properties

Top Venues

Publications

Peter Moens, F. Geenen, L. De Schepper, JF Cano, J. Lettens, S. Maslougkas, J. Franchi, Martin Domeij
The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study. IRPS (2023)
Thomas Neyer, Martin Domeij, Hrishikesh Das, Swapna Sunkari
Is there a perfect SiC MosFETs Device on an imperfect crystal? IRPS (2021)
Josef Lutz, Martin Domeij
Dynamic avalanche and reliability of high voltage diodes. Microelectron. Reliab. 43 (4) (2003)