On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs.

Peter Moens F. Geenen M. Avramenko G. Gomez-Garcia Kevin Matocha

Published in: IRPS (2024)

Keyphrases

key issues
real world
lessons learned
technical challenges
decision making
open issues
neural network
artificial intelligence
high level
trade off
user interface
highly reliable