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Trapping induced parasitic effects in GaN-HEMT for power switching applications.
Gaudenzio Meneghesso
Matteo Meneghini
Enrico Zanoni
Piet Vanmeerbeek
Peter Moens
Published in:
ICICDT (2015)
Keyphrases
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power consumption
data sets
metadata
computer based instruction
negative effects
power distribution
energy dissipation