Lis K. Nanver

Publication Activity (10 Years)

Years Active: 2001-2021
Publications (10 Years): 8

Top Topics

Chemical Vapor Deposition

Thin Film Transistor

Electrical Properties

Silicon Nitride

Top Venues

Publications

Lovro Markovic, Tihomir Knezevic, Lis K. Nanver, Tomislav Suligoj
Modeling and Simulation Study of Electrical Properties of Ge-on-Si Diodes with Nanometer-thin PureGaB Layer. MIPRO (2021)
Max Krakers, T. Kneevic, Lis K. Nanver
Reverse breakdown and light-emission patterns studied in Si PureB SPADs. MIPRO (2019)
Tihomir Knezevic, Tomislav Suligoj, Lis K. Nanver
Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers. MIPRO (2019)
Tihomir Knezevic, Tomislav Suligoj, Xingyu Liu, Lis K. Nanver, Ahmed Elsayed, Jan F. Dick, Jörg Schulze
Back-end-of-line CMOS-compatible diode fabrication with pure boron deposition down to 50 °C. ESSDERC (2019)
Tihomir Knezevic, Lis K. Nanver, Ivana Capan, Tomislav Suligoj
Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures. MIPRO (2018)
Lis K. Nanver
An experimental view on PureB silicon photodiode device physics. MIPRO (2018)
Tihomir Knezevic, Lis K. Nanver, Tomislav Suligoj
Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions. MIPRO (2017)
Vishal Agarwal, Anne-Johan Annema, Satadal Dutta, Raymond J. E. Hueting, Lis K. Nanver, Bram Nauta
Random Telegraph Signal phenomena in avalanche mode diodes: Application to SPADs. ESSDERC (2016)
Negin Golshani, Vahid Mohammadi, Siva Ramesh, Lis K. Nanver
High-ohmic resistors using nanometer-thin pure-boron chemical-vapour-deposited layers. ESSDERC (2013)
Giulia Piccolo, Amir Sammak, Raymond J. E. Hueting, Jurriaan Schmitz, Lis K. Nanver
Role of junction depth in light emission from silicon p-i-n leds. ESSDERC (2013)
Lei Shi, Stoyan N. Nihtianov, Frank Scholze, Lis K. Nanver
Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application. IECON (2012)
Agata Sakic, Lin Qi, Tom L. M. Scholtes, Johan van der Cingel, Lis K. Nanver
n diodes at 400 ºC by Aluminum-Induced Crystallization. ESSDERC (2012)
Lei Shi, Stoyan N. Nihtianov, Sha Xia, Lis K. Nanver, Alexander Gottwald, Frank Scholze
-n VUV/EUV Photodiodes. IEEE Trans. Instrum. Meas. 61 (5) (2012)
Tihomir Knezevic, Tomislav Suligoj, Agata Sakic, Lis K. Nanver
n junctions. MIPRO (2012)
Tihomir Knezevic, Tomislav Suligoj, Agata Sakic, Lis K. Nanver
photodiodes. MIPRO (2011)
Lis K. Nanver, Hugo Schellevis, Tom L. M. Scholtes, Luigi La Spina, Gianpaolo Lorito, Francesco Sarubbi, Viktor Gonda, Milos Popadic, Koen Buisman, Leo C. N. de Vreede, Cong Huang, Silvana Milosavljevic, Egbert J. G. Goudena
Improved RF Devices for Future Adaptive Wireless Systems Using Two-Sided Contacting and AlN Cooling. IEEE J. Solid State Circuits 44 (9) (2009)
W. C. Edmund Neo, Yu Lin, Xiaodong Liu, Leo C. N. de Vreede, Lawrence E. Larson, Marco Spirito, Marco J. Pelk, Koen Buisman, Atef Akhnoukh, Anton de Graauw, Lis K. Nanver
Adaptive Multi-Band Multi-Mode Power Amplifier Using Integrated Varactor-Based Tunable Matching Networks. IEEE J. Solid State Circuits 41 (9) (2006)
N. Nenadovic, V. Cuoco, S. J. C. H. Theeuwen, Lis K. Nanver, Hugo Schellevis, G. Spierings, H. F. F. Jos, J. W. Slotboom
Electrothermal characterization of silicon-on-glass VDMOSFETs. Microelectron. Reliab. 45 (3-4) (2005)
Nebojsa Nenadovic, Slobodan Mijalkovic, Lis K. Nanver, Lode K. J. Vandamme, Vincenzo d'Alessandro, Hugo Schellevis, Jan W. Slotboom
Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors. IEEE J. Solid State Circuits 39 (10) (2004)
Marco Spirito, Leo C. N. de Vreede, Lis K. Nanver, Stephan Weber, Joachim N. Burghartz
Power amplifier PAE and ruggedness optimization by second-harmonic control. IEEE J. Solid State Circuits 38 (9) (2003)
Wibo D. van Noort, Leo C. N. de Vreede, H. F. F. Jos, Lis K. Nanver, Jan W. Slotboom
Reduction of UHF power transistor distortion with a nonuniform collector doping profile. IEEE J. Solid State Circuits 36 (9) (2001)