Olivier Héron

Publication Activity (10 Years)

Years Active: 2003-2023
Publications (10 Years): 8

Top Topics

Integrated Circuit

Fault Injection

Top Venues

J. Electron. Test.

Publications

Thanh-Hai Nguyen, Olivier Héron, Olivier Riou
Towards Privacy-first Manufacturing Data Exchange Platform. SoICT (2023)
Chiara Sandionigi, Olivier Héron
Estimation of oxide breakdown effects by fault injection. IOLTS (2019)
Chiara Sandionigi, Mauricio Altieri, Olivier Héron
Early estimation of aging in the design flow of integrated circuits through a programmable hardware module. DFT (2017)
Mauricio Altieri, Suzanne Lesecq, Edith Beigné, Olivier Héron, Diego Puschini
Tracking BTI and HCI effects at circuit-level in adaptive systems. NEWCAS (2016)
Boukary Ouattara, Olivier Héron, Chiara Sandionigi
Fine-grain analysis of the parameters involved in aging of digital circuits. IOLTS (2016)
Olivier Héron, Chiara Sandionigi, E. Piriou, Safa Mbarek, Vincent Huard
Workload-dependent BTI analysis in a processor core at high level. IRPS (2015)
Mauricio Altieri, Suzanne Lesecq, Diego Puschini, Olivier Héron, Edith Beigné, Jorge Rodas
Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor. PATMOS (2015)
Chiara Sandionigi, Olivier Héron
Identifying aging-aware representative paths in processors. IOLTS (2015)
Chiara Sandionigi, Olivier Héron, Clement Bertolini, Raphaël David
When processors get old: Evaluation of BTI and HCI effects on performance and reliability. IOLTS (2013)
Olivier Héron, Clement Bertolini, Chiara Sandionigi, Nicolas Ventroux, François Marc
On the Simulation of HCI-Induced Variations of IC Timings at High Level. J. Electron. Test. 29 (2) (2013)
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
Impact of Power Consumption and Temperature on Processor Lifetime Reliability. J. Low Power Electron. 8 (1) (2012)
Clement Bertolini, Olivier Héron, Nicolas Ventroux, François Marc
Relation between HCI-induced performance degradation and applications in a RISC processor. IOLTS (2012)
Julien Guilhemsang, Olivier Héron, Nicolas Ventroux, Olivier Goncalves, Alain Giulieri
Impact of the application activity on intermittent faults in embedded systems. VTS (2011)
Abdellah Kouadri, Olivier Héron, Romain Montagné
A Lightweight API for an Adaptive Software Fault Tolerance Using POSIX-Thread Replication. ARCS Workshops (2011)
M. Alexandre Carbon, Olivier Héron, Karim Ben Chehida, Raphaël David
Impact of power management on temperature and reliability evolution for an embedded many-core architecture. ARCS Workshops (2011)
Olivier Héron, Julien Guilhemsang, Nicolas Ventroux, Alain Giulieri
Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies. IOLTS (2010)
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
High Level Power and Energy Exploration Using ArchC. SBAC-PAD (2010)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs. J. Electron. Test. 22 (2) (2006)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs. J. Electron. Test. 21 (1) (2005)
Olivier Héron, Talal Arnaout, Hans-Joachim Wunderlich
On the Reliability Evaluation of SRAM-Based FPGA Designs. FPL (2005)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs. IOLTS (2004)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
High Quality TPG for Delay Faults in Look-Up Tables of FPGAs. DELTA (2004)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs. ETS (2004)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
Requirements for delay testing of look-up tables in SRAM-based FPGAs. ETW (2003)
Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell
Defect Analysis for Delay-Fault BIST in FPGAs. IOLTS (2003)