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Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor.
Mauricio Altieri
Suzanne Lesecq
Diego Puschini
Olivier Héron
Edith Beigné
Jorge Rodas
Published in:
PATMOS (2015)
Keyphrases
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cmos image sensor
sensor data
low cost
circuit design
sensor networks
room temperature
single chip
electric field
mixed signal
real time
high speed
power system
risk management
evaluation model
analog vlsi
charge coupled device