Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs.

Patrick Girard Olivier Héron Serge Pravossoudovitch Michel Renovell

Published in: J. Electron. Test. (2005)

Keyphrases

fault model
fault detection
fault diagnosis
real time embedded systems
real time
response time
test cases
test data
power consumption
fault injection
neural network
sufficient conditions
low power