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Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs.
Patrick Girard
Olivier Héron
Serge Pravossoudovitch
Michel Renovell
Published in:
J. Electron. Test. (2005)
Keyphrases
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fault model
fault detection
fault diagnosis
real time embedded systems
real time
response time
test cases
test data
power consumption
fault injection
neural network
sufficient conditions
low power