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Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs.

Patrick GirardOlivier HéronSerge PravossoudovitchMichel Renovell
Published in: J. Electron. Test. (2005)
Keyphrases
  • fault model
  • fault detection
  • fault diagnosis
  • real time embedded systems
  • real time
  • response time
  • test cases
  • test data
  • power consumption
  • fault injection
  • neural network
  • sufficient conditions
  • low power