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Defect Analysis for Delay-Fault BIST in FPGAs.

Patrick GirardOlivier HéronSerge PravossoudovitchMichel Renovell
Published in: IOLTS (2003)
Keyphrases
  • real time
  • data analysis
  • statistical analysis
  • case study
  • image analysis
  • multiresolution
  • surveillance system
  • transmission line