Jean Godin

Publication Activity (10 Years)

Years Active: 1998-2013
Publications (10 Years): 0

Top Topics

Rayleigh Fading

Top Venues

Bell Labs Tech. J.

Publications

Jean Godin, Agnieszka Konczykowska, Jean-Yves Dupuy, Muriel Riet, Virginie Nodjiadjim, Filipe Jorge, Gabriel Charlet, Oriol Bertran-Pardo, Jérémie Renaudier, Haïk Mardoyan, Alan H. Gnauck, Peter J. Winzer
High Speed Multi-Level Drivers for Spectrally Efficient Optical Transmission Systems. Bell Labs Tech. J. 18 (3) (2013)
Oriol Bertran-Pardo, Jeremie Renaudier, Haïk Mardoyan, P. Tran, Rafael Rios-Müller, Agnieszka Konczykowska, Jean-Yves Dupuy, F. Jorge, Muriel Riet, Bernadette Duval, Jean Godin, Sebastian Randel, Gabriel Charlet, Sébastien Bigo
Transmission of 50-GHz-spaced single-carrier channels at 516Gb/s over 600km. OFC/NFOEC (2013)
Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux
Advancements on reliability-aware analog circuit design. ESSCIRC (2012)
Yves Bouvier, Achour Ouslimani, Agnieszka Konczykowska, Jean Godin
A 40 GSamples/s InP-DHBT Track-and-Hold Amplifier with high dynamic range and large bandwidth. CSNDSP (2012)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51 (9-11) (2011)
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51 (9-11) (2011)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Nils Weimann, Vincent Houtsma, Rose Kopf, Yves Baeyens, Joseph Weiner, Alaric Tate, John Frackoviak, Young-Kai Chen, Gregory Raybon, Jean Godin, Muriel Riet, Virginie Nodjiadjim, Agnieszka Konczykowska, Jean-Yves Dupuy, Filipe Jorge, André Scavennec, Gabriel Charlet
InP DHBT circuits: From device physics to 40Gb/s and 100Gb/s transmission system experiments. Bell Labs Tech. J. 14 (3) (2009)
Jean Godin, Agnieszka Konczykowska, Muriel Riet, Jacques Moulu, Philippe Berdaguer, Filipe Jorge
InP DHBT Integrated Circuits for Fiber-Optic High-Speed Applications. IEICE Trans. Electron. (7) (2006)
J. C. Martin, Cristell Maneux, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectron. Reliab. 43 (9-11) (2003)
André Scavennec, Jean Godin, René Lefevre
40 Gbit/s transmission: III-V integrated circuits for opto-electronic interfaces. Ann. des Télécommunications 58 (9-10) (2003)
Philippe André, Sylvain Blayac, Philippe Berdaguer, Jean-Louis Benchimol, Jean Godin, Nicolas Kauffmann, Agnieszka Konczykowska, Abed-Elhak Kasbari, Muriel Riet
InGaAs/InP DHBT technology and design methodology for over 40 Gb/s optical communication circuits. IEEE J. Solid State Circuits 36 (9) (2001)
Nicolas Kauffmann, Sylvain Blayac, Miloud Abboun, Philippe André, Frédéric Aniel, Muriel Riet, Jean-Louis Benchimol, Jean Godin, Agnieszka Konczykowska
InP HBT driver circuit optimization for high-speed ETDM transmission. IEEE J. Solid State Circuits 36 (4) (2001)
P. Andre, Nicolas Kauffmann, P. Desrousseaux, Jean Godin, Agnieszka Konczykowska
InP HBT circuits for high speed ETDM systems. ISCAS (2) (1999)
Philippe André, Jean-Louis Benchimol, Patrick Desrousseaux, Anne-Marie Duchenois, Jean Godin, Agnieszka Konczykowska, Mounir Meghelli, Muriel Riet, André Scavennec
InP DHBT technology and design methodology for high-bit-rate optical communications circuits. IEEE J. Solid State Circuits 33 (9) (1998)