J. C. Martin

Publication Activity (10 Years)

Years Active: 2003-2007
Publications (10 Years): 0

Publications

A. Benmansour, Stephane Azzopardi, J. C. Martin, Eric Woirgard
A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation. Microelectron. Reliab. 47 (9-11) (2007)
A. Benmansour, Stephane Azzopardi, J. C. Martin, Eric Woirgard
Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions. Microelectron. Reliab. 47 (9-11) (2007)
A. Benmansour, Stephane Azzopardi, J. C. Martin, Eric Woirgard
Failure mechanism of trench IGBT under short-circuit after turn-off. Microelectron. Reliab. 46 (9-11) (2006)
J. C. Martin, Cristell Maneux, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectron. Reliab. 43 (9-11) (2003)