Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors.
Nathalie LabatNathalie MalbertCristell ManeuxAndré TouboulPublished in: Microelectron. Reliab. (2004)
Keyphrases
- low frequency
- diagnostic tool
- high frequency
- frequency domain
- wavelet transform
- wavelet analysis
- subband
- electromagnetic fields
- high resolution
- frequency band
- low pass
- discrete wavelet transform
- high frequency components
- original images
- wavelet coefficients
- field effect transistors
- high density
- digital images
- feature selection
- fusion rules
- feature vectors