Geneviève Duchamp

Publication Activity (10 Years)

Years Active: 2002-2018
Publications (10 Years): 2

Top Topics

Experimental Study

Gallium Arsenide

Data Mining Projects

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

M. Girard, Tristan Dubois, P. Hoffmann, Geneviève Duchamp
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. Microelectron. Reliab. (2018)
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectron. Reliab. (2017)
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55 (9-10) (2015)
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
A New Method for the Characterization of Electronic Components Immunity. IEEE Trans. Instrum. Meas. 64 (9) (2015)
Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp
Characterization and model of temperature effect on the conducted immunity of Op-Amp. Microelectron. Reliab. 55 (9-10) (2015)
Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp
Qualification procedure for moisture in embedded capacitors. Microelectron. Reliab. 54 (9-10) (2014)
Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. EMC Compo (2013)
Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier
A methodological approach for predictive reliability: Practical case studies. Microelectron. Reliab. 52 (12) (2012)
Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot
Control of the electromagnetic compatibility: An issue for IC reliability. Microelectron. Reliab. 51 (9-11) (2011)
Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. Microelectron. Reliab. 49 (9-11) (2009)
Geneviève Duchamp, D. Castagnet, Alain Meresse
Near-field EMC study to improve electronic component reliability. Microelectron. Reliab. 47 (9-11) (2007)
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44 (9-11) (2004)
Geneviève Duchamp, Yves Ousten, Yves Danto
Evaluation of a micropackaging analysis technique by highfrequency microwaves. Microelectron. Reliab. 42 (9-11) (2002)