Login / Signup
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement.
Jean-Baptiste Gros
Geneviève Duchamp
Alain Meresse
Jean-Luc Levant
Published in:
Microelectron. Reliab. (2009)
Keyphrases
</>
mathematical model
experimental data
objective function
significant improvement
management system
parameter estimation
computational model
prior knowledge
probabilistic model
data sets
information systems
decision trees
prediction model
object model