Jean-Luc Levant

Publication Activity (10 Years)

Years Active: 2002-2015
Publications (10 Years): 3

Top Topics

Integrated Circuit

Probability Distribution

Segmentation Method

Top Venues

IEEE Trans. Instrum. Meas.

Microelectron. Reliab.

Publications

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55 (9-10) (2015)
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
A New Method for the Characterization of Electronic Components Immunity. IEEE Trans. Instrum. Meas. 64 (9) (2015)
Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. EMC Compo (2015)
Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot
Control of the electromagnetic compatibility: An issue for IC reliability. Microelectron. Reliab. 51 (9-11) (2011)
Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. Microelectron. Reliab. 49 (9-11) (2009)
Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant, Eric Tinlot, Anne-Marie Trullemans-Anckaert
An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment. Microelectron. J. 35 (6) (2004)
Jean-Luc Levant, Mohammed Ramdani, Richard Perdriau
ICEM modelling of microcontroller current activity. Microelectron. J. 35 (6) (2004)
Anne-Marie Trullemans-Anckaert, Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant
Early Prediction of Conducted-Mode Emission of complex IC's. FDL (2004)
Jean-Luc Levant, Mohammed Ramdani
An EMC-Compliant Design Method of High-Density Integrated Circuits. DATE (2002)