A New Method for the Characterization of Electronic Components Immunity.
Ala AyedTristan DuboisJean-Luc LevantGeneviève DuchampPublished in: IEEE Trans. Instrum. Meas. (2015)
Keyphrases
- experimental evaluation
- high accuracy
- detection method
- computationally efficient
- dynamic programming
- high precision
- pairwise
- significant improvement
- probabilistic model
- em algorithm
- computational cost
- cost function
- preprocessing
- semi supervised
- neural network
- theoretical analysis
- segmentation method
- classification method
- objective function