Tristan Dubois

Publication Activity (10 Years)

Years Active: 2008-2020
Publications (10 Years): 6

Top Topics

Signal Noise Ratio

Experimental Study

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

L. Curos, Tristan Dubois, G. Mejecaze, F. Puybaret, Jean-Michel Vinassa
Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection. ICIT (2020)
M. Girard, Tristan Dubois, P. Hoffmann, Geneviève Duchamp
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. Microelectron. Reliab. (2018)
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectron. Reliab. (2017)
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55 (9-10) (2015)
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
A New Method for the Characterization of Electronic Components Immunity. IEEE Trans. Instrum. Meas. 64 (9) (2015)
Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp
Characterization and model of temperature effect on the conducted immunity of Op-Amp. Microelectron. Reliab. 55 (9-10) (2015)
Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. EMC Compo (2013)
Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, Patrick Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jérémy Raoult, Philippe Calvel
First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors. LATW (2011)
Sylvie Jarrix, Tristan Dubois, R. Adam, Philippe Nouvel, Bruno Azaïs, Daniel Gasquet
Probe Characterization for Electromagnetic Near-Field Studies. IEEE Trans. Instrum. Meas. 59 (2) (2010)
Tristan Dubois, Sylvie Jarrix, Annick Penarier, Philippe Nouvel, Daniel Gasquet, Laurent Chusseau, Bruno Azaïs
Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits. IEEE Trans. Instrum. Meas. 57 (11) (2008)